Email this article An efficient and analytical approach for soft error rate estimation in digital circuits
Abstract
Soft errors due to cosmic rays cause reliability problems during lifetime operation of digital systems, which increase exponentially with Moore’s law. The first step in developing efficient soft error tolerant schemes is to analyze the effect of soft errors at the system level. This enhanced concept develops a systematic approach for soft error rate estimation. The proposed framework is divided in two stages. First, signal probabilities are computed via a hybrid approach combining heuristics and selective simulation of reconvergent subnets. In the second stage, signal probabilities are used to compute the vulnerability of all the gates in a combinational block using a incremental algorithm Experiments on benchmark circuits and comparison of the results with random fault injection (previous work) show that proposed method is accurate while orders of magnitude faster.
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