Electronic Circuits Diagnosis Using Artificial Neural Networks

Yogesh Kumar

Abstract


When we expect  about something that does not treat as it should be,  we are initiating the  process of diagnosis. Diagnosis is a commonly used activity in our everyday lives (Benjamins & Jansweijer, 1990). Complicated systems are always prone to faults or failures. In the simplest term, a fault is every change in a system that prevents it from operating in the proper manner. We define diagnosis as the task of identifying the cause and location of a fault manifested by some observed behaviour. Basically this is  two-stage process: first the fact that fault has occurred must be recognized – this is referred to as fault detection. That is, in general, achieved by testing. Secondly, the nature and location should be determined such that appropriate remedial action may be initiated.


References


Alippi, C., Catelani, M., Mugnaini, M. (2002). SBT Soft Fault Diagnosis in Analog Electronic Circuits: A Sensitivity-Based Approach by Randomized Algorithms, IEEE Transactions on Instrumentation and measurement, Vol. 51, No. 5, pp. 1116-1125.

Aminian, M., and Aminian, F. (2000). Neural-network based analog-circuit fault diagnosis using wavelet transform as preprocessor, IEEE Transactions on CAS – II: Analog and Digital Signal Processing, Vol. 47, No. 2, February 2000, pp. 151-156.

Aminian, F., Aminiam, M., Collins, H. W. (2002). Analog Fault Diagnosis of Actual Circuits Using Neural Networks, IEEE Trans. On Instrumentation and Measurement, Vol. 51, No. 3, June 2002, pp. 544-50, ISSN 0018-9456.

Andrejević, M., Litovski, V. (2004). ANN application in electronic diagnosis-preliminary results , Proceedings of IEEE 24th International Conference on Microelectronics MIEL

Andrejević, M., Litovski, V., Zwolinski, M. (2006). Fault Diagnosis in Digital Part of Mixed-Mode Circuit, Proceedings of IEEE 25th International Conference on Microelectronics MIEL 2006, pp. 437-440, ISBN 1-4244-0116-X, Niš, Serbia, May 2006.

Andrejević, M., Litovski, V. (2006a). Fault Diagnosis in Digital Part of Sigma-Delta Converter, Proceedings of Neurel 2006 Conference, pp. 177-180, ISBN 1-4244-0432-0, Beograd, Serbia, September 2006.

Andrejević, M., Litovski, V. (2006b). Fault Diagnosis in Analog Part of Mixed-mode Circuit, VI Symposium on Industrial Electronics (INDEL 2006), pp. 117-120, Banja Luka, Bosnia and Herzegovina, November 2006.

Andrejević, M., Petrović, V., Mirković, D., Litovski, V. (2006). Delay Defects Diagnosis Using ANNs, Proceedings of L Conference of ETRAN, pp. 27-30., Belgrade, Serbia, June 2006

Andrejević, M. (2006). Artificial neural networks application in electronic circuits diagnosis, PhD Thesis, University of Niš, Serbia, July 2006, (in Serbian).

Bandler, J., and Salama, A. (1985). Fault diagnosis of analog circuits, Proceedings of the IEEE, Vol. 73, No. 8, pp. 1279-1325, ISSN 0018-9219.

Baum, E. B., and Haussler, D. (1989). What size net gives valid generalization, Neural Computing, Vol. 1, pp. 151-60.

Bell, I. M., Camplin, D. A., Taylor, G. E., Bannister, B. R. (1991). Supply Current Testing Of Mixed Analogue And Digital ICs, Electronics letters, Vol. 27, No. 17, pp. 1591-1583, ISSN 0013-5194.

Benjamins, R., Jansweijer, W. (1990). Toward a competence theory of diagnosis, IEEE Expert, Vol. 9, No. 5, pp. 43-52, ISSN 0885-9000.

Catelani, M. and Gori, M. (1996). On the application of neural networks to fault diagnosis of electronic analog circuits, Measurement, Vol. 17, pp. 73-80.

Catelani, M., Giraldi, S. (1998). Fault diagnosis of analog circuits with model based techniques, IEEE Instrum. Meas. Techn. Conference, Vol. V 1, pp. 501-504.

Chang, Y.-H. (2002). Frequency-domain grouping robust fault diagnosis for analog circuits with uncertainties, International Journal of Circuit Theory and Applications, Vol. 30, pp. 65-86, ISSN 0098-9886.

Cherubal, S., Chatterjee, A. (1999). Parametric Fault Diagnosis for Analog Systems Using Functional Mapping, Proceedings of Design, Automation and Test in Europe (DATE '99), p. 195, Munich, Germany.

Collins, P., Yu, S., Eckersaal, K. R., Jervis, B. W., Bell., I. M., and Taylor, G. E. (1994). Application of Cohonen and Supervised Forced Organization Maps to Fault Diagnosis in CMOS Opamps, Electronics letters, Vol. 30, No. 22, pp. 1846-1847, ISSN 0013-5194.

Cota, É. F., Carro, L., Lubaszewski, M. (1999). A Method to Diagnose Faults in Linear Analog Circuits Using an Adaptive Tester, Proceedings of Design, Automation and Test in Europe Conference, DATE ’99, pp. 184-188, Munich, Germany.

Dai, Y., and Xu, J. (1999). Analog circuit fault diagnosis based on noise measurements, Microelectronics and Reliability, Vol. 39(8), pp. 1293-1298, ISSN: 0026-2714.

Dragic, S., and Margala, M. (2002). A 1.2 V Built-in Architecture for High Frequency OnLine Iddq/delta Iddq Test, Proc. IEEE Computer Society Annual Symposium


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